3B002 Category 3B
Test or inspection equipment “specially designed” for testing or inspecting finished or unfinished semiconductor devices as follows (see List of Items Controlled) and “specially designed” “components” and “accessories” therefor.
Category 3: Electronics
Reasons for control
- NS: National security
- RS: Regional stability
- AT: Anti-terrorism
Country chart
| Control | Column |
|---|---|
| AT applies to entire entry | AT 1 |
| NS applies to 3B002.a and b | NS 2 |
| NS applies to 3B002.c | None |
| RS applies to 3B002.c | None |
List-based license exceptions
| Exception | As stated in the entry |
|---|---|
| GBS | Yes |
| LVS | $500, except semiconductor manufacturing equipment specified in 3B002.c. |
Items
- a. For testing S-parameters of items specified by 3A001.b.3.
- b. For testing microwave integrated circuits controlled by 3A001.b.2.
- c. Inspection equipment designed for “EUV” mask blanks or “EUV” patterned masks.
Related controls
See also 3A999.a, 3B992, and 3B993.
Source: eCFR, version
2026-08-01, retrieved
2026-08-20T04:04:59+00:00.